Scientific Director, Canadian Centre for Electron Microscopy (CCEM)
Materials Science and Engineering
Associate Member
Materials Science and Engineering
Nabil Bassim is a Full Professor in the Department of Materials Science and Engineering at McMaster University. Prior to joining McMaster, he was a Materials Research Engineer at the U.S. Naval Research Laboratory from 2003 to 2016, where he developed deep expertise in advanced materials characterization.
His research focuses on developing novel characterization techniques and correlative microscopy workflows, with particular emphasis on semiconductor and functional materials. His toolkit spans x-ray microscopy, FIB-SEM microscopy, atom probe tomography, and transmission electron microscopy (TEM), with a focus on building new experimental instrumentation and workflows and applying them to novel materials and devices. This includes understanding the role of damage and doping in the manufacturing of nanostructured materials, beam scanning strategies, and machine learning-based optimization for microscale additive processes. He applies these techniques across a broad range of materials — from structural materials such as cement, concrete, and steel, to nanomaterials and two-dimensional materials.
Dr. Bassim serves as the Scientific Director of the Canadian Centre for Electron Microscopy (CCEM – ccem.mcmaster.ca), a CFI-funded National User Facility housing some of the most advanced analytical characterization instruments in Canada. He is the author of two major review articles on the FIB and is the co-founder and co-organizer of the FIB-SEM User Meeting (www.fibsem.net), the largest FIB conference in North America, running continuously since 2008.
B.S. Mechanical Engineering – University of South Florida, M.Sc, Ph.D, University of Florida, P.Eng
Related Courses
3 unit(s) An introduction to the theory, physics and operating principles of Scanning electron microscopy (SEM), Focused Ion Beam (FIB) microscopy and attendant diffraction and spectroscopy techniques. The course will have laboratory component allowing students to students to establish core competence in hands-on use of these microscopes.
Cross-listed: MATLS 724 / ENG PHYS 724 / CHEM ENG 724 / MECH ENG 726
3 unit(s) An introduction to the theory, physics and operating principles of Scanning electron microscopy (SEM), Focused Ion Beam (FIB) microscopy and attendant diffraction and spectroscopy techniques. The course will have laboratory component allowing students to students to establish core competence in hands-on use of these microscopes.
Cross-listed: MATLS 724 / ENG PHYS 724 / CHEM ENG 724 / MECH ENG 726
3 unit(s) An introduction to the theory, physics and operating principles of Scanning electron microscopy (SEM), Focused Ion Beam (FIB) microscopy and attendant diffraction and spectroscopy techniques. The course will have laboratory component allowing students to students to establish core competence in hands-on use of these microscopes.
Cross-listed: MATLS 724 / ENG PHYS 724 / CHEM ENG 724 / MECH ENG 726
3 unit(s) An introduction to the theory, physics and operating principles of Scanning electron microscopy (SEM), Focused Ion Beam (FIB) microscopy and attendant diffraction and spectroscopy techniques. The course will have laboratory component allowing students to students to establish core competence in hands-on use of these microscopes.
Cross-listed: MATLS 724 / ENG PHYS 724 / CHEM ENG 724 / MECH ENG 726
