Scientific Director, Canadian Centre for Electron Microscopy (CCEM)
Materials Science and Engineering
Associate Member
Engineering Physics
Dr. Nabil Bassim
Nabil Bassim is an Associate Professor in the Department of Materials Science and Engineering at McMaster University. His research focused on the development of novel electron microscopy techniques and ion microscopy and lithography techniques, including understanding the role of damage and doping in the manufacturing of novel nanostructured materials. He also served the Acting Scientific Director of the Canadian Centre for Electron Microscopy (CCEM – ccem.mcmaster.ca), a CFI-funded Major Science Initiatives National User Facility that is home to the most advanced, cutting edge analytical characterization tools in Canada. Besides studying ion-sample interactions, beam scanning strategies and machine learning-based optimization strategies for machine and depositing materials for microscale additive processes, he also applies these techniques to a diverse set of materials, ranging from structural materials such as cement/concrete and steel to nanomaterials and 2-dimensional materials. He is the author of 2 major review articles on the FIB and is the co-founder and co-organizer of the FIB-SEM User Meeting (www.fibsem.net), which is the largest FIB conference in the North America (12 years). He also serves as the Faculty lead for McMaster Engineering’s Aerospace and Defense Initiative.
B.S. Mechanical Engineering – University of South Florida, M.Sc, Ph.D, University of Florida, P.Eng
Related Courses
3 unit(s) An introduction to the theory, physics and operating principles of Scanning electron microscopy (SEM), Focused Ion Beam (FIB) microscopy and attendant diffraction and spectroscopy techniques. The course will have laboratory component allowing students to students to establish core competence in hands-on use of these microscopes.
Cross-listed: MATLS 724 / ENG PHYS 724 / CHEM ENG 724 / MECH ENG 726
3 unit(s) An introduction to the theory, physics and operating principles of Scanning electron microscopy (SEM), Focused Ion Beam (FIB) microscopy and attendant diffraction and spectroscopy techniques. The course will have laboratory component allowing students to students to establish core competence in hands-on use of these microscopes.
Cross-listed: MATLS 724 / ENG PHYS 724 / CHEM ENG 724 / MECH ENG 726
3 unit(s) An introduction to the theory, physics and operating principles of Scanning electron microscopy (SEM), Focused Ion Beam (FIB) microscopy and attendant diffraction and spectroscopy techniques. The course will have laboratory component allowing students to students to establish core competence in hands-on use of these microscopes.
Cross-listed: MATLS 724 / ENG PHYS 724 / CHEM ENG 724 / MECH ENG 726
3 unit(s) An introduction to the theory, physics and operating principles of Scanning electron microscopy (SEM), Focused Ion Beam (FIB) microscopy and attendant diffraction and spectroscopy techniques. The course will have laboratory component allowing students to students to establish core competence in hands-on use of these microscopes.
Cross-listed: MATLS 724 / ENG PHYS 724 / CHEM ENG 724 / MECH ENG 726
